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Element-specific structural analysis of Si/B
4
C using resonant X-ray reflectivity. Corrigendum
Journal of Applied Crystallography (2016) -
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doi: 10.1107/s1600576716003824 issn: 1600-5767
Maheswar Nayak, P. C. Pradhan, G. S. Lodha
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International Union of Crystallography (IUCr)
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