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Charge Trapping Memory with 2.85-nm Si-Nanoparticles Embedded in HfO
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ECS Transactions (2015) -
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doi: 10.1149/06640.0017ecst issn: 1938-6737 issn: 1938-5862
Nazek El-Atab, Berk Berkan Turgut, Ali Okyay, Ammar Nayfeh
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The Electrochemical Society
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