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Implementation-Independent Test Generation for a Large Class of Faults in RISC Processor Modules
2021 24th Euromicro Conference on Digital System Design (DSD) (2021) -
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doi: 10.1109/dsd53832.2021.00090
Maksim Jenihhin, Adeboye Stephen Oyeniran, Jaan Raik, Raimund Ubar
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