An integrated fuzzy multi-measurement decision-making model for selecting optimization techniques of semiconductor materials

Expert Systems with Applications (2024) - Comments
doi: 10.1016/j.eswa.2023.121439 issn: 0957-4174

Mohammed Al-Samarraay, Omar Al-Zuhairi, Abdullah Alamoodi, Osamah Albahri, Muhammet Deveci, Omar Raed, Ahmed Albahri, Gang Kou