Proceedings of the 33rd ACM SIGSOFT International Symposium on Software Testing and Analysis (2024) - Comments
doi: 10.1145/3650212.3652145 

---

Hao Wang, Zeyu Gao, Chao Zhang, Zihan Sha, Mingyang Sun, Yuchen Zhou, Wenyu Zhu, Wenju Sun, Han Qiu, Xi Xiao