Improving Write Performance on Cross-Point RRAM Arrays by Leveraging Multidimensional Non-Uniformity of Cell Effective Voltage

IEEE Transactions on Computers (2020) - Comments
doi: 10.1109/tc.2020.2990884 issn: 0018-9340 issn: 1557-9956 issn: 2326-3814

Chengning Wang, Dan Feng, Wei Tong, Jingning Liu, Bing Wu, Wei Zhao, Yang Zhang, Yiran Chen