2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) (2022) - Comments
doi: 10.1109/metroxraine54828.2022.9967623 

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Cosimo Tuena, Silvia Serino, Sara Maestri, Elisa Pedroli, Chiara Stramba-Badiale, Giulia Brizzi, Karine Goulene, Pietro Cipresso, Marco Stramba-Badiale, Giuseppe Riva