A metamodel-based adaptive sampling approach for efficient failure region characterization of integrated circuits
2020 XXXV Conference on Design of Circuits and Integrated Systems (DCIS) (2020) - 0 Comments
doi: 10.1109/dcis51330.2020.9268659 

Ingrid Kovacs , Marina Topa , Monica Ene , Andi Buzo , Georg Pelz

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