Tiny compensation of pressure drift measurements due to long exposures to high temperatures

2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) (2023) - Comments
doi: 10.1109/i2mtc53148.2023.10175998

Paola Vitolo, Danilo Pau, Gian Domenico Licciardo, Massimiliano Pesaturo, Stefano Bosco, Santo Pennino