Experimental Characterization and Analysis of an Asynchronous Approach for Reduction of Substrate Noise in Digital Circuitry
IEEE Transactions on Very Large Scale Integration (VLSI) Systems (2012) - Comments
doi: 10.1109/tvlsi.2010.2100835  issn: 1063-8210  issn: 1557-9999 

Jim Le, Christopher Hanken, Martin Held, Michael S. Hagedorn, Kartikeya Mayaram, Terri S. Fiez