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Experimental Characterization and Analysis of an Asynchronous Approach for Reduction of Substrate Noise in Digital Circuitry
IEEE Transactions on Very Large Scale Integration (VLSI) Systems (2012) -
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doi: 10.1109/tvlsi.2010.2100835 issn: 1063-8210 issn: 1557-9999
Jim Le, Christopher Hanken, Martin Held, Michael S. Hagedorn, Kartikeya Mayaram, Terri S. Fiez
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Institute of Electrical and Electronics Engineers (IEEE)
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