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Xiaowei Li, Guihai Yan, Jing Ye, Ying Wang
Search publications for: doi:10.1007/S11432-017-9290-4 1 result
Fault tolerance on-chip: a reliable computing paradigm using self-test, self-diagnosis, and self-repair (3S) approach
Xiaowei Li, Guihai Yan, Jing Ye, Ying Wang