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Brian P. Downey, Suzanne E. Mohney, Trevor E. Clark, Joseph R. Flemish
Search publications for: doi:10.1016/J.MICROREL.2010.07.007 1 result
Reliability of aluminum-bearing ohmic contacts to SiC under high current density
Brian P. Downey, Suzanne E. Mohney, Trevor E. Clark, Joseph R. Flemish