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Donghee Son, Gang-Jun Kim, Ji-Hoon Seo, Nam-Hyun Lee, YongHa Kang, Bongkoo Kang
Search publications for: doi:10.1016/J.MICROREL.2016.01.003 1 result
Degradation of pMOSFETs due to hot electron induced punchthrough
Donghee Son, Gang-Jun Kim, Ji-Hoon Seo, Nam-Hyun Lee, YongHa Kang, Bongkoo Kang