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Yeohyeok Yun, Gang-Jun Kim, Ji-Hoon Seo, Donghee Son, Bongkoo Kang
Search publications for: doi:10.1016/J.MICROREL.2018.07.056 1 result
Method to extract parameters of power law for nano-scale SiON pMOSFETs under negative bias temperature instability
Yeohyeok Yun, Gang-Jun Kim, Ji-Hoon Seo, Donghee Son, Bongkoo Kang