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Yuequan Bao, Huabin Sun, Xiaoshu Guan, Yuxuan Tian
Search publications for: doi:10.1016/J.RESS.2024.110140 1 result
An active learning method based on deep adversarial autoencoder-based sufficient dimension reduction neural network for high-dimensional reliability analysis
Yuequan Bao, Huabin Sun, Xiaoshu Guan, Yuxuan Tian