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G. Gielen, P. De Wit, E. Maricau, J. Loeckx, J. Martin-Martinez, B. Kaczer, G. Groeseneken, R. Rodriguez, M. Nafria
Search publications for: doi:10.1109/DATE.2008.4484862 1 result
Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies
G. Gielen, P. De Wit, E. Maricau, J. Loeckx, J. Martin-Martinez, B. Kaczer, G. Groeseneken, R. Rodriguez, M. Nafria