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Hangkyu Lee, Suriyaprakash Natarajan, Srinivas Patil, Irith Pomeranz
Search publications for: doi:10.1109/DFT.2006.57 1 result
Selecting High-Quality Delay Tests for Manufacturing Test and Debug
Hangkyu Lee, Suriyaprakash Natarajan, Srinivas Patil, Irith Pomeranz