The PubPeer database contains all articles.
To leave the first comment on a specific article, paste a unique identifier such as a DOI, PubMed ID, or arXiv ID into the search bar.
Hassan Ebrahimi, Hans G. Kerkhoff
Search publications for: doi:10.1109/DSD.2016.58 1 result
Testing for Intermittent Resistive Faults in CMOS Integrated Systems
Hassan Ebrahimi, Hans G. Kerkhoff