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Edoardo Ceccarelli, Kevin Manning, Seamus Maxwell, Colm Heffernan
Search publications for: doi:10.1109/IRPS.2019.8720590 1 result
GIDL Increase Due to HCI Stress: Correlation Study of MOSFET Degradation Parameters and Modelling for Reliability Simulation
Edoardo Ceccarelli, Kevin Manning, Seamus Maxwell, Colm Heffernan