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S. Hamdioui, Z. Al-Ars, A.J. Van De Goor, M. Rodgers
Search publications for: doi:10.1109/TCAD.2004.826578 1 result
Linked Faults in Random Access Memories: Concept, Fault Models, Test Algorithms, and Industrial Results
S. Hamdioui, Z. Al-Ars, A.J. Van De Goor, M. Rodgers