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Teruyoshi HATANAKA, Mitsue TAKAHASHI, Shigeki SAKAI, Ken TAKEUCHI
Search publications for: doi:10.1587/TRANSELE.E94.C.539 1 result
Improvement of Read Disturb, Program Disturb and Data Retention by Memory Cell VTH Optimization of Ferroelectric (Fe)-NAND Flash Memories for Highly Reliable and Low Power Enterprise Solid-State Drives (SSDs)
Teruyoshi HATANAKA, Mitsue TAKAHASHI, Shigeki SAKAI, Ken TAKEUCHI