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Yuanhong Qiu, Shuanlong Niu, Tongzhi Niu, Weifeng Li, Bin Li
Search publications for: doi:10.3390/SYM14071473 1 result
Joint-Prior-Based Uneven Illumination Image Enhancement for Surface Defect Detection
Yuanhong Qiu, Shuanlong Niu, Tongzhi Niu, Weifeng Li, Bin Li