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Maksim Jenihhin, Adeboye Stephen Oyeniran, Jaan Raik, Raimund Ubar
Search publications for: doi:10.1109/DSD53832.2021.00090 1 result
Implementation-Independent Test Generation for a Large Class of Faults in RISC Processor Modules
Maksim Jenihhin, Adeboye Stephen Oyeniran, Jaan Raik, Raimund Ubar